ISPRS-Archives ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences ISPRS-Archives Int. Arch. Photogramm. Remote Sens. Spatial Inf. Sci. 2194-9034 Copernicus Publications Göttingen, Germany 10.5194/isprs-archives-XLIII-B3-2020-287-2020 DEFORMATION MONITORING USING SAR INTERFEROMETRY AND ACTIVE AND PASSIVE REFLECTORS Crosetto M. 1 https://orcid.org/0000-0001-8545-5490 Luzi G. 1 Monserrat O. 1 Barra A. 1 https://orcid.org/0000-0001-6254-7931 Cuevas-González M. 1 Palamá R. 1 Krishnakumar V. 1 Wassie Y. 1 Mirmazloumi S. M. 1 Espín-López P. 1 Crippa B. 2 Centre Tecnològic de Telecomunicacions de Catalunya, Division of Geomatics, Av. Gauss, 7 E-08860 Castelldefels, Spain Department of Earth Sciences, Section of Geophysics, University of Milan, Via Cicognara 7, I-20129, Milan, Italy 21 08 2020 XLIII-B3-2020 287 292 Copyright: © 2020 M. Crosetto et al. 2020 This work is licensed under the Creative Commons Attribution 4.0 International License. To view a copy of this licence, visit https://creativecommons.org/licenses/by/4.0/ This article is available from https://isprs-archives.copernicus.org/articles/isprs-archives-XLIII-B3-2020-287-2020.html The full text article is available as a PDF file from https://isprs-archives.copernicus.org/articles/isprs-archives-XLIII-B3-2020-287-2020.pdf

This paper is focused on SAR interferometry for deformation monitoring, based on the use of passive and active reflectors. Such reflectors are needed in all cases where a sufficient response from the ground is not available. In particular, the paper describes the development of a low-cost active reflector. This development was carried out in an EU H2020 project called GIMS. The paper summarizes the key characteristics of the developed active reflector. The reflector was tested in two main experiments: the first one located in the campus of CTTC and the second one in a GIMS test site located in Slovenia. The experiments demonstrate the visibility of the active reflectors and provide the first results concerning the phase stability of such devices.