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<front>
<journal-meta>
<journal-id journal-id-type="publisher">ISPRS-Archives</journal-id>
<journal-title-group>
<journal-title>The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences</journal-title>
<abbrev-journal-title abbrev-type="publisher">ISPRS-Archives</abbrev-journal-title>
<abbrev-journal-title abbrev-type="nlm-ta">Int. Arch. Photogramm. Remote Sens. Spatial Inf. Sci.</abbrev-journal-title>
</journal-title-group>
<issn pub-type="epub">2194-9034</issn>
<publisher><publisher-name>Copernicus Publications</publisher-name>
<publisher-loc>Göttingen, Germany</publisher-loc>
</publisher>
</journal-meta>
<article-meta>
<article-id pub-id-type="doi">10.5194/isprs-archives-XLIX-B1-2026-299-2026</article-id>
<title-group>
<article-title>The concept of metrological validation of active measurement sensors - CENAGIS-MET</article-title>
</title-group>
<contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Markiewicz</surname>
<given-names>Jakub</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Łapiński</surname>
<given-names>Sławomir</given-names>
<ext-link>https://orcid.org/0000-0003-0403-7911</ext-link>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Macek</surname>
<given-names>Adrian</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Wiśniewski</surname>
<given-names>Mariusz</given-names>
</name>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
</contrib>
</contrib-group><aff id="aff1">
<label>1</label>
<addr-line>Warsaw University of Technology, Faculty of Geodesy and Cartography, Plac Politechniki 1, 00-661 Warsaw, Poland</addr-line>
</aff>
<aff id="aff2">
<label>2</label>
<addr-line>Central Office of Measures, ul. Elektoralna 2, 00-139 Warsaw, Poland</addr-line>
</aff>
<pub-date pub-type="epub">
<day>22</day>
<month>07</month>
<year>2026</year>
</pub-date>
<volume>XLIX-B1-2026</volume>
<fpage>299</fpage>
<lpage>306</lpage>
<permissions>
<copyright-statement>Copyright: &#x000a9; 2026 Jakub Markiewicz et al.</copyright-statement>
<copyright-year>2026</copyright-year>
<license license-type="open-access">
<license-p>This work is licensed under the Creative Commons Attribution 4.0 International License. To view a copy of this licence, visit <ext-link ext-link-type="uri"  xlink:href="https://creativecommons.org/licenses/by/4.0/">https://creativecommons.org/licenses/by/4.0/</ext-link></license-p>
</license>
</permissions>
<self-uri xlink:href="https://isprs-archives.copernicus.org/articles/XLIX-B1-2026/299/2026/isprs-archives-XLIX-B1-2026-299-2026.html">This article is available from https://isprs-archives.copernicus.org/articles/XLIX-B1-2026/299/2026/isprs-archives-XLIX-B1-2026-299-2026.html</self-uri>
<self-uri xlink:href="https://isprs-archives.copernicus.org/articles/XLIX-B1-2026/299/2026/isprs-archives-XLIX-B1-2026-299-2026.pdf">The full text article is available as a PDF file from https://isprs-archives.copernicus.org/articles/XLIX-B1-2026/299/2026/isprs-archives-XLIX-B1-2026-299-2026.pdf</self-uri>
<abstract>
<p>Advances in optical measurement technologies have increased demands for accuracy, speed, and automation in coordinate metrology. This contribution introduces CENAGIS-MET, a metrological verification standard developed at the Warsaw University of Technology for assessing active range-based systems such as terrestrial laser scanners (TLS). Unlike traditional calibration fields designed for small ranges, CENAGIS-MET enables evaluation over large measurement areas, in accordance with modified VDI/VDE guidelines. The methodology incorporates probing error, sphere-spacing error, and flatness assessment using high-precision ceramic artefacts. Tests were conducted on Leica RTC360, Leica Nova MS60, Z+F 5006h, and a handheld Livox-based scanner (Mandeye). Results show RTC360 and MS60 fully meet the 1/5 relative error criterion, confirming suitability for engineering-grade applications. Z+F 5006h achieves partial compliance, requiring careful configuration, while Mandeye exceeds permissible thresholds, limiting its use to qualitative documentation. The article provided broader analyses of the accuracy of 3D shape reconstruction used for probing error, as well as roughness and planarity assessments to evaluate the overall distribution of the reference plane.</p>
</abstract>
<counts><page-count count="8"/></counts>
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