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<front>
<journal-meta>
<journal-id journal-id-type="publisher">ISPRS-Archives</journal-id>
<journal-title-group>
<journal-title>The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences</journal-title>
<abbrev-journal-title abbrev-type="publisher">ISPRS-Archives</abbrev-journal-title>
<abbrev-journal-title abbrev-type="nlm-ta">Int. Arch. Photogramm. Remote Sens. Spatial Inf. Sci.</abbrev-journal-title>
</journal-title-group>
<issn pub-type="epub">2194-9034</issn>
<publisher><publisher-name>ISPRS</publisher-name>
<publisher-loc>Göttingen, Germany</publisher-loc>
</publisher>
</journal-meta>
<article-meta>
<article-id pub-id-type="doi">10.5194/isprsarchives-XXXIX-B5-423-2012</article-id>
<title-group>
<article-title>MULTIDIMENSIONAL ROUGHNESS CHARACTERIZATION FOR MICROWAVE REMOTE SENSING APPLICATIONS USING A SIMPLE PHOTOGRAMMETRIC ACQUISITION SYSTEM</article-title>
</title-group>
<contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Marzahn</surname>
<given-names>P.</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Rieke-Zap</surname>
<given-names>D.</given-names>
</name>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Wegmuller</surname>
<given-names>U.</given-names>
</name>
<xref ref-type="aff" rid="aff3">
<sup>3</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Ludwig</surname>
<given-names>R.</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
</contrib>
</contrib-group><aff id="aff1">
<label>1</label>
<addr-line>Ludwig-Maximilians University of Munich Luisenstrasse 37, 80333 Munich, Germany</addr-line>
</aff>
<aff id="aff2">
<label>2</label>
<addr-line>Institute of Geological Science University of Bern Baltzerstrasse 1+3, CH-3012 Bern, Schwitzerland</addr-line>
</aff>
<aff id="aff3">
<label>3</label>
<addr-line>Gamma Remote Sensing Worbstr. 225, CH-3073 Guemlingen, Schwitzerland</addr-line>
</aff>
<pub-date pub-type="epub">
<day>30</day>
<month>07</month>
<year>2012</year>
</pub-date>
<volume>XXXIX-B5</volume>
<fpage>423</fpage>
<lpage>428</lpage>
<permissions>
<copyright-statement>Copyright: &#x000a9; 2012 P. Marzahn et al.</copyright-statement>
<copyright-year>2012</copyright-year>
<license license-type="open-access">
<license-p>This work is licensed under the Creative Commons Attribution 3.0 Unported License. To view a copy of this licence, visit <ext-link ext-link-type="uri"  xlink:href="https://creativecommons.org/licenses/by/3.0/">https://creativecommons.org/licenses/by/3.0/</ext-link></license-p>
</license>
</permissions>
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<abstract>
<p>Soil surface roughness, as investigated in this study, is a critical parameter in microwave remote sensing. As soil surface roughness
is treated as a stationary single scale isotropic process in most backscattering models, the overall objective of this study was to better
understand the role of soil surface roughness in the context of backscattering. Therefore a simple photogrametric acquisition setup
was developed for the characterization of soil surface roughness. In addition several suited SAR images of different sensors (ERS-2
and TerraSAR-X) were acquired to quantify the impact of soil surface roughness on the backscattered signal. Major progress achieved
in this work includes the much improved characterization of in-field soil surface roughness. Good progress was also made in the
understanding of backscattering from bare surface in the case of directional scattering.</p>
</abstract>
<counts><page-count count="6"/></counts>
</article-meta>
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