Pre-processing of Xeva-XS imagery for determining spectral reflectance coefficients in laboratory conditions
P. Walczykowski,A. Orych,M. Kedzierski,and A. Fryskowska
P. Walczykowski
Department of Remote Sensing and Photogrammetry, Geodesy Institute, Faculty of Civil Engineering and Geodesy, Military University of Technology, Warsaw, Poland
A. Orych
Department of Remote Sensing and Photogrammetry, Geodesy Institute, Faculty of Civil Engineering and Geodesy, Military University of Technology, Warsaw, Poland
M. Kedzierski
Department of Remote Sensing and Photogrammetry, Geodesy Institute, Faculty of Civil Engineering and Geodesy, Military University of Technology, Warsaw, Poland
A. Fryskowska
Department of Remote Sensing and Photogrammetry, Geodesy Institute, Faculty of Civil Engineering and Geodesy, Military University of Technology, Warsaw, Poland
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