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Articles | Volume XXXVIII-3/W22
https://doi.org/10.5194/isprsarchives-XXXVIII-3-W22-179-2011
https://doi.org/10.5194/isprsarchives-XXXVIII-3-W22-179-2011
26 Apr 2013
 | 26 Apr 2013

SIMULATION OF CLOSE-RANGE PHOTOGRAMMETRIC SYSTEMS FOR INDUSTRIAL SURFACE INSPECTION

T. Becker, M. Özkul, and U. Stilla

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