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28 Jun 2021
             
         
    A NOVEL METHOD FOR INSPECTION DEFECTS IN COMMERCIAL EGGS USING COMPUTER VISION 
        
            Y. M. Valencia, J. J. Majin, V. B. Taveira, J. D. Salazar, M. E. Stivanello, L. C. Ferreira, and M. R. Stemmer
        
            
            
            
            
            
            
            
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