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Articles | Volume XLIII-B3-2022
https://doi.org/10.5194/isprs-archives-XLIII-B3-2022-237-2022
https://doi.org/10.5194/isprs-archives-XLIII-B3-2022-237-2022
30 May 2022
 | 30 May 2022

A NOVEL SAMPLE LABELLING CRITERION FOR PIN DEFECT DETECTION IN UAV IMAGE

K. Ying and J. Wang

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